Patents

  • US patent #9,757,027 B2 - System and method for performing tear film structure measurement and evaporation rate measurements.
  • US patent #9,833,139 B1 - System and method for performing tear film structure measurement¬†
  • European patent #3,113,668 B1 - System and method for performing tear film structure measurement and evaporation rate measurements.
  • US patent #10,456,029 B2¬†- Apparatus and method for detecting surface topography
  • European patent #3434173B1 - System and method for performing tear film structure measurement